The following information lists the typical analytical performance limits for new instruments using installation setup parameter settings/conditions.
This test measures the peak width of a suite of analytical lines distributed over the surface of the chip and compares them to a specification. This test requires an analysis to be run and the multi-element standard and blank solutions. The Instrument Performance test software will use the data from the generated worksheet to calculate the Full Width at Half Maximum - FWHM (that is, the width of the peak at half its height). Results are generated and displayed in the Instrument Performance test results.
Signal to Background ratios are calculated using SRBR = (Total intensity - blank intensity) / Square Root blank intensity)
Precision is 10 replicates of sample readings on the multi-element standard.